7 results
Exfoliated ∼25μm Si Foil for Solar Cells with Improved Light-Trapping
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1493 / 2013
- Published online by Cambridge University Press:
- 25 February 2013, pp. 51-58
- Print publication:
- 2013
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Integration Challenges of Inorganic Low-K (K≤2.5) Materials with CU for Sub-0.25μm Multilevel Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 565 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 151
- Print publication:
- 1999
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Integration Challenges of Inorganic Low-K (K≤2.5) Materials with Cu for Sub-0.25µm Multilevel Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 564 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 499
- Print publication:
- 1999
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Critical Length and Resistance Saturation Effects in Al(Cu) Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 231
- Print publication:
- January 1998
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Statistical Evaluation of Stressmigration Reliability in Al-Cu Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 65
- Print publication:
- January 1998
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A Comparative Study on Electromigration Failure Mechanism Between Near-Bamboo and Bamboo Al(Cu) Two-Level Structure
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 265
- Print publication:
- 1995
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Line width Dependence of Stress Relaxation and Yield Behavior of Passivated Al(Cu) Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 281
- Print publication:
- 1994
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