6 results
Direct observation of polarization-induced two-dimensional electron/hole gases at ferroelectric-insulator interface
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 712-713
- Print publication: August 2021
-
- Article
-
- You have access
- Export citation
Observation of Charge Separation along BiFeO3 109° Domain Walls by Using Low-convergence Angle 4-Dimensional Scanning Transmission Electron Microscopy
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 234-235
- Print publication: August 2020
-
- Article
-
- You have access
- Export citation
Observation of Dislocation-Assisted 2-Dimensional Conductive Channels Embedded in Perovskite Thin Films
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 2410-2411
- Print publication: August 2019
-
- Article
-
- You have access
- Export citation
Defect-assisted Reorganization of Ferroelectric Domain Walls Revealed by Aberration-corrected Electron Microscopy
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 104-105
- Print publication: August 2018
-
- Article
-
- You have access
- Export citation
Interaction between Ferroelectric Polarization and Defects in BiFeO3 Thin Films
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 1604-1605
- Print publication: July 2017
-
- Article
-
- You have access
- Export citation
Size Effect on Spontaneous Flux-closure Domains in BiFeO3Thin Films
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 1596-1597
- Print publication: July 2016
-
- Article
-
- You have access
- Export citation