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20 results

  • Spatially-resolved STEM-EELS of waveguide modes
  • David Kordahl, Duncan Alexander, Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
  • Published online by Cambridge University Press: 30 July 2021, pp. 108-111
  • Print publication: August 2021
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  • Harnessing Shape Effects for Adsorbate Signal Enhancement in Vibrational EELS
  • David Kordahl, Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
  • Published online by Cambridge University Press: 05 August 2019, pp. 608-609
  • Print publication: August 2019
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  • Prospects for Spatially-Resolved EELS of Atomic Point Defects
  • Christian Dwyer, David Kordahl, Weiqing Xu, Shery L.Y. Chang
  • Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
  • Published online by Cambridge University Press: 05 August 2019, pp. 594-595
  • Print publication: August 2019
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  • Inpainting Versus Denoising for Dose Reduction in STEM
  • Toby Sanders, Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
  • Published online by Cambridge University Press: 01 August 2018, pp. 482-483
  • Print publication: August 2018
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  • Measurement of N-V Centers in Nanodiamond Particles using Advanced (S)TEM
  • Shery L. Y. Chang, Katia March, Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
  • Published online by Cambridge University Press: 01 August 2018, pp. 1664-1665
  • Print publication: August 2018
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  • Dipole Scattering and Its Implications for Vibrational Mapping at Lattice Resolution
  • Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
  • Published online by Cambridge University Press: 01 August 2018, pp. 410-411
  • Print publication: August 2018
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  • Multidisciplinary Approach to Nanostructure Determination
  • Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
  • Published online by Cambridge University Press: 25 July 2016, pp. 1426-1427
  • Print publication: July 2016
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  • Quantitative Position-Averaged K-, L-, and M-Shell Core-Loss Scattering in STEM
  • Ye Zhu, Christian Dwyer
  • Journal: Microscopy and Microanalysis / Volume 20 / Issue 4 / August 2014
  • Published online by Cambridge University Press: 13 May 2014, pp. 1070-1077
  • Print publication: August 2014
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    We present a quantitative comparison between experimental position-averaged core-loss scattering from K-, L-, and M-shells of various elements and simulations based on a single-particle description of the core-loss process. To facilitate a direct comparison free of adjustable or compensating parameters, we compare absolute scattering cross-sections for zone-axis-aligned crystals whose thicknesses have been measured independently. The results show that the single-particle model accurately predicts the absolute scattering intensity from K-shells, and L-shells in some cases, but achieves only semi-quantitative agreement for M-shells.

  • Scanning Confocal Electron Energy-Loss Microscopy Using Valence-Loss Signals
  • Huolin L. Xin, Christian Dwyer, David A. Muller, Haimei Zheng, Peter Ercius
  • Journal: Microscopy and Microanalysis / Volume 19 / Issue 4 / August 2013
  • Published online by Cambridge University Press: 22 May 2013, pp. 1036-1049
  • Print publication: August 2013
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    Finding a faster alternative to tilt-series electron tomography is critical for rapidly evolving fields such as the semiconductor industry, where failure analysis could greatly benefit from higher throughput. We present a theoretical and experimental evaluation of scanning confocal electron energy-loss microscopy (SCEELM) using valence-loss signals, which is a promising technique for the reliable reconstruction of materials with sub-10-nm resolution. Such a confocal geometry transfers information from the focused portion of the electron beam and enables rapid three-dimensional (3D) reconstruction by depth sectioning. SCEELM can minimize or eliminate the missing-information cone and the elongation problem that are associated with other depth-sectioning image techniques in a transmission electron microscope. Valence-loss SCEELM data acquisition is an order of magnitude faster and requires little postprocessing compared with tilt-series electron tomography. With postspecimen chromatic aberration (Cc) correction, SCEELM signals can be acquired in parallel in the direction of energy dispersion with the aid of a physical pinhole. This increases the efficiency by 10×–100×, and can provide 3D resolved chemical information for multiple core-loss signals simultaneously.