The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

The Reference Intensity Ratio (RIR) is a general, instrument-independent constant for use in quantitative phase analysis by the X-ray powder diffraction internal standard method. When the reference standard is corundum, RIR is known as I/Ic; These constants are collected in the Powder Diffraction File (1987), can be calculated, and can be measured. Recommended methods for accurate measurement of RIR constants are presented, and methods of using these constants for quantitative analysis are discussed. The numerous, complex constants in Copeland and Bragg's method introduced to account for superimposed lines can be simply expressed in terms of RIR constants and relative intensities. This formalism also permits introduction of constraints and supplemental equations based on elemental analysis.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with 1 or 2 internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

X-ray powder patterns for the phases in the CaO-SrO-CuO ternary system, along with the corresponding crystal structures, were obtained from the literature and from the Powder Diffraction File. Available XRD patterns were compared with each other and with a calculated pattern for each phase, yielding a recommended reference pattern. The simulated powder patterns presented here deal with the phases found within the (Ca,Sr)O, (Ca,Sr)2CuO3, (Ca,Sr)14Cu24O41, (Ca,Sr)CuO2, (Ca,Sr)Cu2O3, and (Ca,Sr)Cu2O2 solid solution series and are recommended for the Powder Diffraction File (PDF).

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement.

X-ray powder patterns for the phases in the CaO-SrO-PbO ternary system, along with the corresponding crystal structures, were obtained from the literature and from the Powder Diffraction File. Available XRD patterns were compared with each other and with a simulated pattern for each phase, yielding a recommended reference pattern. The simulated powder patterns presented here deal with the phases found within the (Ca,Sr)2PbO4solid solution series and are recommended for the Powder Diffraction File (PDF).

Ba0.5+x/2Zr2P3−xSixO12 or BaZPS compounds were synthesized by the sintering of powders formed by a solid-state reaction. The cell parameters of Ba0.5Zr2P3O12 and Ba0.5875Zr2P2.825Si0.175O12 were determined from X-ray diffraction (XRD) data based on the (#148) space group with hexagonal setting. The cell parameters were found to increase with increasing Si content in BaZPS.

The Powder Diffraction File of crystallographic data has been converted from printed data cards to a computer database. Extensive testing, review, and editing of the database were completed, the history and first stages of which are presented. Computer programs used to create and analyze the database are described.

Fifteen reference patterns of oxides, nitrides, borides, carbides, silicides, and sulfides are included in this report. The general methods of producing these X-ray powder diffraction reference patterns are described in this Journal, Vol. 1, No. 1, pg. 40(1986).

Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Intensities were measured as peak heights above background and were read manually from strip charts. To minimize preferred orientation effects, the powders were passed through a 400 mesh sieve and were mixed with an amorphous diluent material, glass powder. Samples were prepared by side-drifting the mixture into the holder or by dusting a thin layer on a glass slide coated with a thin smear of silicone grease.

The support and interest of the ICDD in this project is gratefully acknowledged. The expert guidance of R. Roth of the Ceramics Division on material synthesis and the careful review of the manuscript by S. Block of the Ceramics Division and A. D. Mighell of the Reactor Division are fully appreciated. Acknowledgement is also extended to D. Minor for performing sample analysis by using SEM. In the production of these standard powder patterns, the ability to search NBS CRYSTAL DATA has proven invaluable.

Residual strains and microstresses are evaluated for both phase of a hot-pressed, fine-grained α-alumina reinforced with 25 wt% (29 vol%) single-crystal silicon carbide whiskers at temperatures from 25 to 1000 °C. The sample was maintained in a nonoxidizing environment while measurements of the interplaner spacing of alumina (146) and SiC (511 + 333) were made using X-ray diffraction methods. The residual strains were profiled at temperature increments of 250 °C from which the corresponding microstresses were calculated. Linear extrapolation of the SiC ε33 profile indicates that the strains are completely relaxed at a temperature of approximately 1470 °C. These residual stress relaxation results suggest that elevated temperature toughness and fracture strength of this composite may result from cooperative mechanisms.

The following fifteen reference patterns of boride, silicide and oxide ceramics represent the first group of ceramic phases measured at the National Bureau of Standards under the project “High Quality Reference Patterns and Total Digital Powder Patterns of Technologically Important Ceramic Phases”. The support and interest of the JCPDS-ICDD in this project is gratefully acknowledged.

The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40(1986).

Tetragonal zirconia (t- ZrCO2) can be stabilized with 15 to 22 mol% YTaO4. X-ray powder diffraction data for the end members of the solid solution series Zr0.76Y0.12Ta0.12O2 and Zr0.66Y0.17Ta0.17O2 are reported along with lattice parameters across the single phase region. These tetragonal zirconias are characterized by large tetragonalities (c/ √ 2a > 1.0203) and nontransformability to the monoclinic structure.

Patterns useful for identification are obtained by automated diffractometer methods. The lattice constants from the experimental work are refined by least-squares methods; reflections are assigned hkℓ indices consistent with space group extinctions. Relative intensities, calculated densities, literature references, and other relevant data are included.

The following fourteen reference patterns of carbide, nitride, telluride, and oxide ceramics are reported. Included in the fourteen reference patterns are data for three high Tc superconducting oxide related phases (Ba2CuO3, CuSrO2, and Ba2Cu3YO6). The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).

Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

The following sixteen reference patterns of boride, silicide, nitride and oxide ceramics represent the second group of reference patterns measured at the National Bureau of Standards under the project “High Quality Reference Patterns and Total Digital Powder Patterns of Technologically Important Ceramic Phases”. Included in the sixteen reference patterns are data for two high Tc superconducting oxide phases (CuSr0.2La1.8O4 and Ba2Cu3YO7) plus one related phase (BaCuY2O5). In addition to these new phases, five other patterns represent phases previously not contained in the PDF and eight represent major corrections to data in the file. The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).