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An Efficient Technique to Quantify Dislocation Densities Imaged Through Annular Dark Field Scanning Transmission Electron Microscopy
C.T. Schamp, P.Y. Hung, B.G. Min
Journal:

Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012

Published online by Cambridge University Press:

23 November 2012, pp. 1038-1039

Print publication:

July 2012
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quick Sample Preparation and EFTEM Elemental Characterization of FAB Based Defects
C.T. Schamp, B.T. Valdez, J. Gazda
Journal:

Microscopy Today / Volume 16 / Issue 3 / May 2008

Published online by Cambridge University Press:

14 March 2018, pp. 52-53

Print publication:

May 2008
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A purpose of microscopy is to magnify and enhance contrast between different regions of a sample, whether those regions may be different structures, different orientations of the same structure, regions of different atomic weight, or different chemistries. In the present case, elemental mapping in the energy filtered transmission electron microscope (EFTEM) is used to enhance contrast between elements in an apparent bundle of fibers previously seen through scanning electron microscopy (SEM) and a particle that appears to be a catalytic source for the fibers.

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