Density/porosity and stiffness are the most critical parameters determining properties of porous films, however they are difficult to measure. Here we report characterization of density/porosity and Young's modulus values of a range of nanoporous silica aerogel films via dispersion of laser-generated wideband surface acoustic waves. Results are compared to dielectric constant, Rutherford Backscattering Spectrometry (RBS), Ellipsometric Porosimetry (EP) and Nanoindentation (NI). RBS density correlates well to SAW. EP and NI also show a correlation, however the absolute values do not match. Low Young's modulus values show that the film stiffness is drastically reduced with increasing porosity. The technique is rapid, nondestructive and relatively inexpensive, and yields absolute values of nanoporous aerogel elastic properties which are useful for process control and are difficult to access with other techniques.