13 results
Reel-to-Reel Electron Microscopy: Latency-Free Continuous Imaging of Large Sample Volumes
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 157-158
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- August 2015
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First Nucleotide Sequence Data from an Electron Microscopy Based DNA Sequencer
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 208-209
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- August 2013
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DNA Sequencing by Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1274-1275
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- July 2011
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Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1462-1463
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- July 2009
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Aberration Correction in Energy Loss Spectrometers and Monochromators
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 210-211
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- July 2009
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UltraSTEM Progress: Flexible Electron Optics, High-Performance Sample Stage
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 878-879
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- August 2007
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Aberration-corrected Precession Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 96-97
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- August 2007
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Statistical Treatment of Precession Electron Diffraction Data with Principal Components Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 954-955
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- August 2007
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Precession Electron Diffraction: Optimized Experimental Conditions to Detect Valence Charge Density
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 950-951
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- August 2007
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High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1104-1105
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- August 2006
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Electron Precession for Routine Crystallography
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 780-781
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- August 2005
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An Aberration-Corrected STEM for Diffraction Studies
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 544-545
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- August 2005
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Prospects for Aberration Corrected Nanocrystallogrphy
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, p. 30
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- August 2004
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