5 results
Performance Characterization of Hitachi HD-2300A STEM with Dual-EDS Configuration
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 942-943
- Print publication:
- July 2010
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Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 884-885
- Print publication:
- July 2010
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Lithographically Defined Epitaxy via Focused Ion Beam Induced Lattice Damage
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 236-237
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- July 2010
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Charge-contrast in SEM imaging with simultaneous ion bombardment
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1012-1013
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- August 2008
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Beam skirting effects on energy deposition profile in VP-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1208-1209
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- August 2008
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