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This article reviews post-analysis processing methods for data acquired using atom probe tomography (APT). Field-induced aberrations of APT images arise from distorted ion flight trajectories and differences in ion evaporation rates. Addressing this issue requires the development of image processing tools that yield three-dimensionally reconstructed images that reliably reflect the original specimens. One of the biggest advantages of the APT technique is its ability to collect information about millions of individual atoms. Understanding these data requires the development of mathematical and statistical data mining tools, involving disciplines beyond the basic physics of APT. The above issues have important implications for addressing materials science-related questions.