3 results
Source and Drain Contacts for Germanium and III–V FETs for Digital Logic
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- Journal:
- MRS Bulletin / Volume 34 / Issue 7 / July 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 522-529
- Print publication:
- July 2009
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Post-stress/breakdown leakage mechanism in ultrathin high-κ (HfO2)x(SiO2)1-x/SiO2 gate stacks: A nanoscale conductive-Atomic Force Microscopy C-AFM
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1108 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1108-A10-06
- Print publication:
- 2008
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Alloy clustering and defect structure in the molecular beam epitaxy of In0.53Ga0.47As on silicon
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- Journal:
- Journal of Materials Research / Volume 7 / Issue 8 / August 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2194-2204
- Print publication:
- August 1992
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