6 results
Determining the 3D Atomic Structure of Metallic Glass
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 224-226
- Print publication:
- August 2022
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Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 256-257
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- August 2019
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SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 112-113
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- August 2019
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Generalized Proximal Smoothing for Phase Retrieval
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 118-119
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- August 2019
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GENFIRE: from Precisely Localizing Single Atoms in Materials to High Resolution 3D Imaging of Cellular Structures
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1446-1447
- Print publication:
- August 2018
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GENFIRE: A Generalized Fourier Iterative Reconstruction Algorithm for High-Resolution 3D Electron and X-ray Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 128-129
- Print publication:
- July 2017
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