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Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1891-1892
- Print publication:
- August 2015
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High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2217-2218
- Print publication:
- August 2015
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Characterization of Elastic Strain Field and Geometrically Necessary Dislocation Distribution in Stress Corrosion Cracking of 316 Stainless Steels by Transmission Kikuchi Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 605-606
- Print publication:
- August 2015
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