Stressor-controlled epitaxy has been proposed as an efficient method of CdSe quantum dot fabrication. The studies are performed on a type-II CdSe/BeTe system, where CdTe and BeSe inteface bonds play a role of intrinsic stressors. Predeposition of ~0.2 ML CdTe stressor ( Δ a/a= +15%), corresponding to a local maximum of RHEED specular spot intensity, appears to induce variation of stress field across the BeTe surface, caused by alternating regions with CdTe and BeSe bonds. It results in preferential nucleation of regularly arranged CdSe QDs at the BeSe sites with the following vertical chess-ordering in the CdSe/BeTe multilayers. The structures demonstrate bright up to RT PL in the 1.9-2.1 eV range and strong in-plane PL anisotropy related to non-equivalent bottom and top CdSe QD interfaces having estimated from x-ray diffraction total concentrations of CdTe and BeSe bonds of 0.3-0.4 and 0.6-0.7 ML, respectively.