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Resistive Switching Studies of ReRAM Devices by In-Situ TEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S1 / February 2019
- Published online by Cambridge University Press:
- 07 February 2019, pp. 71-72
- Print publication:
- February 2019
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Analysis of Pt-Nanoparticles Embedded on Crystalline TiO2 Studied by Transmission Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 638 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, F5.41.1
- Print publication:
- 2000
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