The electronic properties of sulfur containing CIS chalcopyrite alloys have been characterized using junction capacitance methods. Two devices were examined; one containing CuIn(S,Se)2 alloy with a 1:2 S:Se ratio and a bandgap near 1.15eV, and the other an endpoint CuInS2 alloy with a bandgap slightly above 1.5eV. Drive-level capacitance profiling measurements indicated hole carrier densities of less than 1 x 1015 cm-3 and 1.5 x 1016 cm-3, respectively. Transient photocapacitance (TPC) sub-bandgap spectroscopic measurements revealed sharp bandtails plus a broad defect band within the bandgap of each alloy. The TPC spectra for the CuInS2 sample revealed a couple of unusual features, including a bandtail signal that reversed sign below 250K. This indicated poorer hole collection than electron collection in the low temperature regime. Comparing these results to TPC spectra obtained previously for Cu(InGa)Se2 alloys indicate some similarities but also some striking differences.