In this paper, we demonstrate the successful implementation of an onwafer noise parameters test set that employs an extended six-port network and a conventional noise figure analyzer. The necessary formulation that enables the calibration of the noise parameter test set as well as extraction of the noise wave correlation matrix of a two-port device under test (DUT) was tested for coaxial connector-type DUT measurement in an earlier work but not for onwafer-type DUT. Furthermore, we demonstrate the performance of this technique against data obtained from the well-known tuner method. Measurement carried out for very low-noise figure (2 dB) onwafer-type amplifier demonstrates the capability of our technique. The measured noise parameters show fluctuations in minimum noise figure, NFmin of ±0.1 dB, and in noise resistance Rn of about 2%. This test set is simple and fast leading to tremendous time- and cost-savings as well as a simplified procedure in onwafer noise parameters measurements.