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Analytical modeling of reservoir effect on electromigration in Cu interconnects
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 1 / January 2007
- Published online by Cambridge University Press:
- 03 March 2011, pp. 152-156
- Print publication:
- January 2007
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Reservoir effect and the role of low current density regions on electromigration lifetimes in copper interconnects
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- Journal:
- Journal of Materials Research / Volume 21 / Issue 9 / September 2006
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2241-2245
- Print publication:
- September 2006
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