2 results
Evaluation of Current Ramp Test for In-Line Electromigration Test
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 127
- Print publication:
- 1999
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- Article
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In-Situ Electromigration Damage of Al Interconnect Lines and the Influence of Grain Orientation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 109
- Print publication:
- 1999
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- Article
- Export citation