As a tribute to the scientific work of Professor Gareth Thomas
in the field of structure-property relationships this paper
delineates a new possibility of Lorentz transmission electron
microscopy (LTEM) to study the magnetic properties of soft magnetic
films. We show that in contrast to the traditional point of
view, not only does the direction of the magnetization vector
in nano-crystalline films make a correlated small-angle wiggling,
but also the magnitude of the magnetization modulus fluctuates.
This fluctuation produces a rapid modulation in the LTEM image.
A novel analysis of the ripple structure in nano-crystalline
Fe-Zr-N film corresponds to an amplitude of the transversal
component of the magnetization ΔMy
of 23 mT and a longitudinal fluctuation of the magnetization of the
order of ΔMx = 30 mT. The nano-crystalline
(Fe99Zr1)1−xNx
films have been prepared by DC magnetron reactive sputtering with
a thickness between 50 and 1000 nm. The grain size decreased
monotonically with N content from typically 100 nm in the case
of N-free films to less than 10 nm for films containing 8 at%.
The specimens were examined with a JEOL 2010F 200 kV transmission
electron microscope equipped with a post column energy filter
(GIF 2000 Gatan Imaging Filter). For holography, the microscope
is mounted with a biprism (JEOL biprism with a 0.6 μm diameter
platinum wire).