Two complementary speckle techniques for the measurement of temperature from the rough back surface of Si wafers during rapid thermal processing are demonstrated. Electronic speckle pattern interferometry is a full field intensity cross-correlation technique that provides a two-dimensional map of the surface temperature. Measurements are presented that demonstrate a resolution of ∼ ±2°C. A new speckle technique, sub-feature speckle interferometry is introduced. This technique provides a much more rapid and precise averaged temperature measurement by monitoring the strain between two points with interferometric precision usually associated with moird interferometry or holography rather than speckle. Preliminary measurements are presented that demonstrate the capability of the technique.

Interest in the arms race has been growing in recent years as shown by coverage in the media and in political campaigns. Many students coming to class are already preconditioned either for or against increased defense spending. This participatory exercise allows them to test their ideas, and it helps make their minds more receptive to new concepts being explored in the class, such as: Is detente in the best interests of the Unted States? Should a new SALT Treaty be negotiated? What is the best ratio of expenditures for domestic programs and national defense?

SDB stands for Secret Defense Budgets. In the SDB exercise, or game as it is called, the class is divided into groups of two students sitting next to each other.