The recombination dynamics of excitons in GaN / Ga0.93Al0.07N multiple quantum wells is studied versus lattice temperature. The average decay time of photoluminescence measured at 8K is of ∼330 ps, with a substantial variation of times within the emission line. This is interpreted in terms of carrier localization due to alloy disorder and to well width and depth variations. The radiative lifetime τr of excitons in the wells is found to increase linearly with temperature, with ∂τr / ∂T = 20.5 ± 0.7 ps.K−1. The radiative lifetime of free excitons in the low-temperature limit is deduced to be 2.4 ps, consistent with a longitudinal-transverse splitting ћωLT in GaN of 0.6 meV, in excellent agreement with recent estimations. The ratio of the lifetimes of localized and free excitons is found coherent with the picture of electrons and holes independently localized on short-range defects, instead of excitons localized as a whole on long-range potential fluctuations.