Please note, due to essential maintenance online transactions will not be possible between 02:30 and 04:00 BST, on Tuesday 17th September 2019 (22:30-00:00 EDT, 17 Sep, 2019). We apologise for any inconvenience.
To send content items to your account,
please confirm that you agree to abide by our usage policies.
If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account.
Find out more about sending content to .
To send content items to your Kindle, first ensure email@example.com
is added to your Approved Personal Document E-mail List under your Personal Document Settings
on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part
of your Kindle email address below.
Find out more about sending to your Kindle.
Note you can select to send to either the @free.kindle.com or @kindle.com variations.
‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi.
‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.
We demonstrated the fabrication of 10 emitters InGaN laser diode array of the
maximum output power of 9 W at 420 nm. The device as a whole has the
differential efficiency of above 1 W/A. The maximum output power is limited to 9
W (pulse operation) by catastrophic mirror damage or to around 5 W in CW
operation by thermal roll-over. Larger arrays with stripes width of around 15
µm and numbers of emitters up to 20 should enable reaching 20 W, which
is suitable for light engine of desktop projectors and a building block of
cinema theater projectors.
We discuss main degradation mechanisms present in nitride based laser diodes operating in 400-440 nm spectral range. We can clearly divide the aging processes into these occurring on the exposed facets of the device and into the bulk phenomena. Surface processes are predominantly connected with photochemical reactions on the laser mirrors and manifest by the formation of the carbon deposits. The nature of these photochemical reactions resembles very closely the mechanism known as Package Induced Failure observed previously in case of 980 nm laser diodes. Degradation involving bulk like effects is much less understood. The experimental results by other group are not sufficient for proposing an unambiguous model of the physical effects involved. In particular, it consists in observation related to dopants diffusion and recombination mechanisms. Magnesium diffusion from the p-type layers into the active layer was proposed as a possible degradation path. However, our study of SIMS profiles in the device subjected to over 8 000 h of electrical stress reveals no visible modification in the Mg profile. The same holds for the hydrogen spatial distribution thus substantially limiting candidates for the diffusion processes. Nevertheless, it seems that the diffusion mechanism is involved in bulk degradation. The claim is supported by two facts: well confirmed stability of the extended defects network in nitride emitters and characteristic square-root time-dependence of the degradation rate.
Email your librarian or administrator to recommend adding this to your organisation's collection.