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Annealing Effects on the Phase and Electronic Structure Evolutions of SiO Film by Electron Energy Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 642-643
- Print publication:
- August 2006
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- Article
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