4 results
Atomic Resolution Investigation of Ultra-Low Energy Ion-Implanted Monolayer TMDs Using Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2538-2540
- Print publication:
- August 2022
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Quantification of Ion-Implanted Single-Atom Dopants in Monolayer MoS2 via HAADF STEM Using the TEMUL Toolkit
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 20 June 2022, pp. 1407-1416
- Print publication:
- August 2022
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Controlled Functionalisation of 2-D Materials for Quantum Device Development: assessment of Single Atom Behaviour via Atomic Resolution Electron Microscopy and Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2558-2559
- Print publication:
- August 2020
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New Single Photon Sources by Optoelectronic Tailoring of 2D Materials Using Low Energy Ion Implantation
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2832-2833
- Print publication:
- August 2020
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