4 results
Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1472-1473
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- July 2010
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Simulation of Atomic Resolution Images in STEM
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 922-923
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- August 2008
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Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 418-419
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- August 2008
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Quantitative HAADF-STEM and EELS
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1352-1353
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- August 2008
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