3 results
Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS)
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1165-1166
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Advantages of Helium and Neon Ion Beams for Intelligent Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 338-339
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 4 / August 2011
- Published online by Cambridge University Press:
- 12 July 2011, pp. 637-642
- Print publication:
- August 2011
-
- Article
- Export citation