2 results
Effect of Line Width on Electromigration of Textured Pure Aluminum Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 345
- Print publication:
- 1993
-
- Article
- Export citation
Room-temperature epitaxy of Cu on Si(111) using partially ionized beam deposition
-
- Journal:
- Journal of Materials Research / Volume 5 / Issue 5 / May 1990
- Published online by Cambridge University Press:
- 31 January 2011, pp. 989-997
- Print publication:
- May 1990
-
- Article
- Export citation