2 results
Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 904-905
- Print publication:
- July 2012
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SIMS Imaging and 3D Microanalysis of Organic Structures
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 412-413
- Print publication:
- July 2010
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- Article
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