4 results
F69 Certified reference materials: the heart of accurate XRF analysis
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- Journal:
- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 176
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Thermal rectification of porous semiconductor materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1735 / 2015
- Published online by Cambridge University Press:
- 16 March 2015, mrsf14-1735-cc09-37
- Print publication:
- 2015
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Fabrication and Characterization of Nanostructured Thermoelectric Materials and Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1735 / 2015
- Published online by Cambridge University Press:
- 08 April 2015, mrsf14-1735-cc14-35
- Print publication:
- 2015
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Modeling of Undercooling, Nucleation, and Multiple Phase Front Formation in Pulsed-Laser-Melted Amorphous Silicon*
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- Journal:
- MRS Online Proceedings Library Archive / Volume 35 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 159
- Print publication:
- 1984
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