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Characterization of Nanoporous Materials with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 20 May 2015, pp. 557-563
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- June 2015
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MRS Contributes to Sound Science Policy
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- Journal:
- MRS Bulletin / Volume 33 / Issue 12 / December 2008
- Published online by Cambridge University Press:
- 31 January 2011, p. 1132
- Print publication:
- December 2008
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MRS Prepares for the Future
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- Journal:
- MRS Bulletin / Volume 33 / Issue 10 / October 2008
- Published online by Cambridge University Press:
- 31 January 2011, p. 893
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- October 2008
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The Old and the New
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- Journal:
- MRS Bulletin / Volume 33 / Issue 1 / January 2008
- Published online by Cambridge University Press:
- 31 January 2011, p. 3
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- January 2008
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Analysis of Local Strain in Aluminum Interconnects by Convergent Beam Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 390-398
- Print publication:
- October 2003
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Localized Measurement of Strains in Damascene Copper Interconnects by Convergent-Beam Electron Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D8.5.1
- Print publication:
- 2000
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Stress and Plastic Flow in Silicon During Amorphization by Ion-Bombardment
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- Journal:
- MRS Online Proceedings Library Archive / Volume 157 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 635
- Print publication:
- 1989
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