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Taking Full Control: Leveraging Software Customizability and Open-Source Hardware to Tailor FIB Instrument Controls
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 20-21
- Print publication:
- August 2022
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- Article
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Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 806-807
- Print publication:
- August 2018
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