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Virtual dark-field images reconstructed from electron diffraction patterns

Published online by Cambridge University Press:  21 April 2014

Edgar F. Rauch  and
Muriel Véron
Edgar F. Rauch*
Affiliation:
Science et Ingénierie des Matériaux et des Procédés – (CNRS UMR 5266) INPG-UJF, BP 46, 38402 Saint Martin d’Hères Cedex, France
Muriel Véron
Affiliation:
Science et Ingénierie des Matériaux et des Procédés – (CNRS UMR 5266) INPG-UJF, BP 46, 38402 Saint Martin d’Hères Cedex, France
*
ae-mail: edgar.rauch@simap.grenoble-inp.fr
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Abstract

Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 66 , Issue 1 , April 2014 , 10701
Copyright
© EDP Sciences, 2014

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References

Rauch, E.F., Veron, M., J. Mater. Sci. Eng. Technol. 36, 552 (2005)
Rauch, E.F., Portillo, J., Nicolopoulos, S., Bultreys, D., Rouvimov, S., Moeck, P., Z. Kristallogr. 225, 103 (2010)CrossRef
Eddahbi, M., Rauch, E.F., Mater. Sci. Eng. A 502, 13 (2009)CrossRef