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Virtual dark-field images reconstructed from electron diffraction patterns

  • Edgar F. Rauch (a1) and Muriel Véron (a1)

Abstract

Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction.

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[1] Rauch, E.F., Veron, M., J. Mater. Sci. Eng. Technol. 36, 552 (2005)
[2] Rauch, E.F., Portillo, J., Nicolopoulos, S., Bultreys, D., Rouvimov, S., Moeck, P., Z. Kristallogr. 225, 103 (2010)
[3] Eddahbi, M., Rauch, E.F., Mater. Sci. Eng. A 502, 13 (2009)

Virtual dark-field images reconstructed from electron diffraction patterns

  • Edgar F. Rauch (a1) and Muriel Véron (a1)

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