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Study on preferred crystal orientations of Mg-Zr-O composite protective layer in AC-PDP

  • G. Bingang (a1), L. Chunliang (a2), S. Zhongxiao (a2), L. Liu (a2), F. Yufeng (a2), X. Xing (a2) and F. Duowang (a3)...

Abstract

In order to study the preferred crystal orientations of Mg-Zr-O composite protective layers in PDP, Mg-Zr-O composite protective layers were deposited by Electron-beam Evaporator using (MgO+ZrO2) powder mixture as evaporation source material. X-ray diffractometer (XRD) was used to determine preferred crystal orientations of Mg-Zr-O composite protective layers, surface morphologies of films were analyzed by FESEM and voltage characteristics were examined in a testing macroscopic discharge cell of AC-PDP. On the basis of experimental analysis, the influence of oxide addition and deposition conditions on preferred orientations of Mg-Zr-O composite protective layers were investigated. The results showed that the preferred orientations of Mg-Zr-O films were determined by lattice distortion of MgO crystal. The deposition conditions have great effects on the preferred orientations of Mg-Zr-O films. The preferred orientations affect voltage characteristics through affecting surface morphology of Mg-Zr-O films. A small amount of Zr solution in MgO can decrease firing voltage compared with using pure MgO film. Firing voltage is closely related with the [ ZrO2/(MgO+ZrO2)] ratio of evaporation source materials.

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Keywords

Study on preferred crystal orientations of Mg-Zr-O composite protective layer in AC-PDP

  • G. Bingang (a1), L. Chunliang (a2), S. Zhongxiao (a2), L. Liu (a2), F. Yufeng (a2), X. Xing (a2) and F. Duowang (a3)...

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