Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-20T03:14:24.856Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure and optical constants of electron beam deposited zinc nitride films

Published online by Cambridge University Press:  22 September 2009

H. A. Mohamed
H. A. Mohamed*
Affiliation:
Physics department, Faculty of Science, Sohag University, 82524 Sohag, Egypt Physics department, Teachers College, King Saud University, 11148 Riyadh, KSA
*
hussein_abdelhafez2000@yahoo.com
Get access

Abstract

Zinc nitride (ZnN) films were prepared by electron beam evaporation technique. The effect of heat treatments on the structural and optical properties of these films were studied. The as-deposited films show amorphous structure and some peaks which are related to Zn3N2 and ZnO can be observed for annealed films. The study of the optical gap shows that these films have direct optical band gap about 3.2 eV at temperature 350 °C. At high temperature, the ZnN films become more opaque and resistive. Other optical parameters such as refractive index, extinction coefficient and dispersion parameters were investigated as a function of annealing temperature.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 48 , Issue 2 , November 2009 , 20504
Copyright
© EDP Sciences, 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Nomura, K., Ohta, H., Ueda, K., Kamiya, T., Hirano, M., Hosono, H., Science 300, 1269 (2003) CrossRef
Wager, J.F., Science 300, 1245 (2003) CrossRef
Fortunato, E.M.C., Barquinha, P.M.C., Pimentel, A., Goncalves, A., Marques, A., Pereira, L., Martins, R., Adv. Mater. 17, 590 (2005) CrossRef
Martins, R., Barquinha, P., Ferreira, I., Pereira, L., Goncalves, G., Fortunato, E., J. Appl. Phys. 101, 044505 (2007) CrossRef
Hong, D., Chiang, H.Q., Wager, F.G., J. Vac. Sci. Technol. B 24, L23 (2006) CrossRef
R. Martins, in 2nd Int. Symposium on Transparent Conductive Oxides (ISTCO), Crete, Greece, Oct. 21–24, 2008
Kumoni, H., Nomura, K., Kamiya, T., Hosono, H., Thin Solid Films 516, 1516 (2008) CrossRef
Fortunato, E.M.C., Pereira, L.M.N., Barquinha, P.M.C., A.M.B. do Rego, G. Gonçalves, A. Vilà, J.R. Morante, R.F.P. Martins, Appl. Phys. Lett. 92, 222103 (2008) CrossRef
E. Aperathitis, V. Kambilafka, M. Modreanu, Thin Solid Films (2009) (in press)
Kuriyama, K., Takahashi, Y., Sunohara, F., Phys. Rev. B 48, 2781 (1993) CrossRef
Futsuhara, M., Yoshioka, K., Takai, O., Thin Solid Films 322, 274 (1998) CrossRef
Toyoura, K., Tsujimura, H., Goto, T., Hachiya, K., Hagiwara, R., Ito, Y., Thin Solid Films 492, 88 (2005) CrossRef
Du, W., Zong, F., Ma, H., Ma, J., Zhang, M., Feng, X., Li, H., Zhang, Z., Zhao, P., Cryst. Res. Technol. 41, 889 (2006) CrossRef
Zong, F., Ma, H., Du, W., Ma, J., Zhang, X., Xiao, H., Ji, F., Xue, C., Appl. Surf. Sci. 252, 7983 (2006) CrossRef
Suda, T., Kakishita, K., J. Appl. Phys. 99, 076101-1 (2006) CrossRef
Yang, T., Zhang, Z., Li, Y., Lv, M., Song, S., Wu, Z., Yan, J., Han, S., Appl. Surf. Sci. 255, 3544 (2009) CrossRef
Mohamed, H.A., J. Phys. D: Appl. Phys. 40, 4234 (2007) CrossRef
Kim, H., Horwitz, J., Kim, W., Makinen, A., Kafafi, Z., Chrisey, D., Thin Solid Films 420–421, 539 (2002) CrossRef
Wolff, P., Phys. Rev. 126, 405 (1962) CrossRef
Ali, H.M., Mohamed, H.A., Wakkad, M.M., Hasaneen, M.F., Thin Solid Films 515, 3024 (2007) CrossRef
Kambilafka, V., Voulgaropoulou, P., Dounisb, S., Iliopoulos, E., Androulidaki, M., Šály, V., Ružinský, M., Aperathitis, E., Superlatt. Microstruct. 42, 55 (2007) CrossRef
Kambilafka, V., Voulgaropoulou, P., Dounis, S., Iliopoulos, E., Androulidaki, M., Tsagaraki, K., Šály, V., Ružinský, M., Prokein, P., Aperathitis, E., Thin Solid Films 515, 8573 (2007) CrossRef
J. Tauc, in Amorphous and Liquid Semiconductors, edited by J. Tauc (Plenum Press, New York, 1979), p. 159
Sahay, P.P., Tewari, S., Nath, R.K., Cryst. Res. Technol. 42, 723 (2007) CrossRef
Mohamed, H.A., Ali, H.M., Sci. Technol. Adv. Mater. 9, 025016 (2008) CrossRef
Weijtens, C.H.L., Van Loon, P.A.C., Thin Solid Films 196, 1 (1991) CrossRef
Saadeddin, I., Pecquenard, B., Manaud, J.P., Decourta, R., Labrugére, C., Buffeteau, T., Campet, G., Appl. Surf. Sci. 253, 5240 (2007) CrossRef
Yakuphanoglu, F., Cukurovali, A., Yilmaz, I., Physica B 353, 210 (2004) CrossRef
Haitjema, H., Elich, J.J.Ph., Thin Solid Films 205, 93 (1991) CrossRef
Ederth, J., Hezler, P., Hulatåker, A., Niklasson, G.A., Granqvist, C.G., Thin Solid Films 445, 199 (2003) CrossRef
Mohameda, H.A., Ali, H.M., Mohamed, S.H., Abd El, M.M.-Raheem, Eur. Phys. J. Appl. Phys. 34, 7 (2006) CrossRef