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Spectroscopic study of resonant dielectric structures in near-field*

Published online by Cambridge University Press:  15 March 1999

S. Davy ,
D. Barchiesi ,
M. Spajer  and
D. Courjon
S. Davy
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
D. Barchiesi*
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
M. Spajer
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
D. Courjon
Affiliation:
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
*
dominique.barchiesi@univ-fcomte.fr
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Abstract

Gratings can be considered as resonant structures in near-field. The enhancement of the intensity recorded by Scanning Near-Field Optical Microscopes (SNOM) is due to interferences in relation with the ratio of the wavelength to the product of the optical index by the period of the grating. We discuss the effect of this ratio (in the range 0.9, 1.1) on the intensity patterns. The influence of the polarization on near-field data is analyzed in both theoretical computations and experimental result.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 5 , Issue 3 , March 1999 , pp. 277 - 281
Copyright
© EDP Sciences, 1999

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Footnotes

*

This paper was presented at the special CFMCP colloquium held at Strasbourg-Illkirch the July 1st-3rd, 1998.

References

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