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Shot noise in macroscopic CdTe resistors: experimental evidence and analytical study

Published online by Cambridge University Press:  14 January 2009

I. Asaad*
Affiliation:
HIRLA, Department of Optoelectronics, Damascus University, Syria
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Abstract

In this work, we present experimental evidence and analytical studies of dark current noise spectral density in CdTe detectors for a low and mid frequency range. The measured noise level in CdTe detectors indicates shot noise suppression at 10 KHz; this suppression can occur in CdTe detectors when the diffusion time is greater than the transit time between electrodes. Moreover we show thermal noise is negligible in CdTe resistors, taking into account their high resistance: R # 150 G${\rm \Omega} $.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2008

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