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Optical and structural properties of ZnSxSe1−x thin films deposited by thermal evaporation

Published online by Cambridge University Press:  04 July 2009

M. Ashraf ,
S. M.J. Akhtar ,
M. Mehmood  and
A. Qayyum
M. Ashraf
Affiliation:
Optics Laboratories, P.O. Box 1021, Islamabad, Pakistan
S. M.J. Akhtar
Affiliation:
Optics Laboratories, P.O. Box 1021, Islamabad, Pakistan
M. Mehmood
Affiliation:
Pakistan Institute of Engineering and Applied Sciences, P.O. Nilore, Islamabad, Pakistan
A. Qayyum*
Affiliation:
Physics Division, Pakistan Institute of Nuclear Science and Technology, P.O. Nilore, Islamabad, Pakistan
*
qayyum@pinstech.org.pk
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Abstract

The ZnSxSe$_{1-x}$ (0 ≤x≤ 1) films were deposited on soda lime glass substrates by thermal evaporation technique. Optical and structural properties of these films were compared with the ZnSxSe$_{1-x}$ films deposited by various other techniques. XRD measurement showed that ZnSxSe$_{1-x}$ films are polycrystalline in nature with the preferred orientation along [111]. It was observed that the lattice constant decreases and the optical energy band gap increases with the sulfur content of the film. These results are in good agreement with the properties of ZnSxSe$_{1-x}$ films deposited by various other methods. Additionally, it was observed that the refractive index of a ZnSxSe$_{1-x}$ film decreases with increasing sulfur content. The results reported in this paper suggest that the lattice constants, optical energy band gap and refractive index of ZnSxSe$_{1-x}$ film can be tailored for a specific application by selecting suitable value of x.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 48 , Issue 1 , October 2009 , 10501
Copyright
© EDP Sciences, 2009

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