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Ion beam assisted deposition of organic light emitting devices: Enhanced optoelectronic properties

Published online by Cambridge University Press:  15 October 1998

R. Antony
Affiliation:
UMOP, Faculté des Sciences, 123 avenue Albert Thomas, 87060 Limoges Cedex, France
A. Moliton*
Affiliation:
UMOP, Faculté des Sciences, 123 avenue Albert Thomas, 87060 Limoges Cedex, France
B. Ratier
Affiliation:
UMOP, Faculté des Sciences, 123 avenue Albert Thomas, 87060 Limoges Cedex, France
C. Moussant
Affiliation:
UMOP, Faculté des Sciences, 123 avenue Albert Thomas, 87060 Limoges Cedex, France
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Abstract

We present optoelectronic characteristics of organic light-emitting devices realized by Ion Beam Assisted Deposition (IBAD) of Alq3 (8-hydroxyquinoline aluminum) layer between an ITO anode and a Ca/Al cathode. The ion type is Iodine ion and the study against the ion beam energy (contained between 50 eV and 150 eV) indicates an optimization of the optoelectronic properties (internal quantum efficiency and luminance) at 100 eV while the optimized localization of the assisted layer is the area 25–50 nm. The characteristics log (J) = f (log [V]) indicates that the injection process takes place by trapped-charge-limited current and an estimation of the trap density Nt leads to Nt ≈ 10 14 cm−3; the enhanced optoelectronic properties of devices obtained by IBAD are attributed to the limitation of quenching sites in the recombination area and also to charge carrier confinement at the interface assisted layer and virgin (non-assisted) layer.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 1998

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