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Investigation of the structural, optical and electrical properties of Nd-doped ZnO thin films deposited by spray pyrolysis

Published online by Cambridge University Press:  31 January 2013

A. Douayar
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
P. Prieto
Affiliation:
Departmento de Física Aplicada C-XII, Universidad Autόnoma de Madrid, Madrid, Spain
G. Schmerber
Affiliation:
IPCMS,UMR CNRS 7504 UDS-ECPM, 23 rue du Loess, B.P. 43, 67034 Strasbourg, France
K. Nouneh
Affiliation:
MASCIR Moroccan Advanced Science, Innovation and Research Foundation, ENSET, Av. Armée Royale, Rabat, Morocco
R. Diaz
Affiliation:
Departmento de Física Aplicada C-XII, Universidad Autόnoma de Madrid, Madrid, Spain
I. Chaki
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
S. Colis
Affiliation:
IPCMS,UMR CNRS 7504 UDS-ECPM, 23 rue du Loess, B.P. 43, 67034 Strasbourg, France
A. El Fakir
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
N. Hassanain
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
A. Belayachi
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
Z. Sekkat
Affiliation:
MASCIR Moroccan Advanced Science, Innovation and Research Foundation, ENSET, Av. Armée Royale, Rabat, Morocco
A. Slaoui
Affiliation:
InESS, UMR CNRS 7163 UDS, 23 rue du Loess, B.P. 43, 67037 Strasbourg, France
A. Dinia
Affiliation:
IPCMS,UMR CNRS 7504 UDS-ECPM, 23 rue du Loess, B.P. 43, 67034 Strasbourg, France
M. Abd-Lefdil*
Affiliation:
Université Mohammed V-Agdal, Faculté des Sciences, LPM, B.P. 1014, Rabat, Morocco
*
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Abstract

Neodymium-doped zinc oxide (NZO) thin films were deposited on glass substrates by spray pyrolysis technique. X-ray diffraction patterns have shown that both undoped and Nd-doped ZnO films exhibit the hexagonal wurtzite crystal structure with a preferential orientation along [0 0 2] direction.

The effective doping concentration has been determined by Rutherford backscattering measurements showing that the neodymium is not incorporated easily into ZnO host matrix. The surface roughness was shown to increase with Nd doping. NZO films are highly transparent in the visible region. The lowest electrical resistivity value of about 4.0 10−2 Ω cm was obtained for 1% Nd effective doping.

Type
Research Article
Copyright
© EDP Sciences, 2013

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