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E-field extraction from Hx- and Hy- near field values by using plane wave spectrum method

Published online by Cambridge University Press:  23 December 2010

B. Ravelo ,
Z. Riah ,
D. Baudry  and
B. Mazari
B. Ravelo*
Affiliation:
IRSEEM-EA 4353, Engineering School ESIGELEC, Technopole de Madrillet, Avenue Galilée, BP 10024, 76801 Saint-Étienne-du-Rouvray Cedex, France
Z. Riah
Affiliation:
IRSEEM-EA 4353, Engineering School ESIGELEC, Technopole de Madrillet, Avenue Galilée, BP 10024, 76801 Saint-Étienne-du-Rouvray Cedex, France
D. Baudry
Affiliation:
IRSEEM-EA 4353, Engineering School ESIGELEC, Technopole de Madrillet, Avenue Galilée, BP 10024, 76801 Saint-Étienne-du-Rouvray Cedex, France
B. Mazari
Affiliation:
IRSEEM-EA 4353, Engineering School ESIGELEC, Technopole de Madrillet, Avenue Galilée, BP 10024, 76801 Saint-Étienne-du-Rouvray Cedex, France
*
blaise.ravelo@esigelec.fr
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Abstract

This paper deals with a technique for calculating the 3D E-field components knowing only the two components (Hx and Hy) of the H-field in near-zone. The originality of the under study technique lies on the possibility to take into account the evanescent wave influences. The presented E-field extraction process is based on the exploitation of the Maxwell-Ampere relation combined with the plane wave spectrum (PWS) method. The efficiency of the proposed technique is evidenced by comparing the E-field deduced from H-field and the own E-field radiated by the association of electrical- and also magnetic- elementary dipoles in different configurations by using Matlab text programming environment. In addition, as a concrete demonstrator, the concept was also validated with the computation of EM-wave radiated by an open-end microstrip transmission line. As result of comparison, very good agreement between the exact E-field and that one extracted from the H-field was realized by considering the near-field scanned at the height, z = 5 mm and 8 mm above the under test structure at the operating frequency, f = 1 GHz. The presented technique can simplify the difficulties about the E-near-field measurement in EMC applications.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 53 , Issue 1 , January 2011 , 11201
Copyright
© EDP Sciences, 2010

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References

F. Klotz, in Proc. of 18th Int. Symp. EMC, Zurich, 2007, pp. 73–78
B.D. Sonia, M. Ramdani, E. Sicard, in Electromagnetic compatibility of integrated circuits. Techniques for low emission and susceptibility (Springer, New York, 2006), p. 464
R. Perdriau, M. Ramdani, J.L. Levant, A.M. Trullemans, in Proc. of IEEE Int. Symp. Industrial Electronics, Ajaccio, France, 2004, Vol. 14, pp. 193–198
J.E. Bringas, in Handbook of Comparative World Steel Standards, 3rd edn. (ASTM International, 2004), p. 18
http://www.iec.ch/zone/emc/emc_cis.htm
http://telecom-info.telcordia.com/site-cgi/ido
Essakhi, B., Baudry, D., Maurice, O., Louis, A., Pichon, L., Mazari, B., Eur. Phys. J. Appl. Phys. 38, 275 (2007) CrossRef
Iwanami, M., Yamazaki, E., Nakano, K., Sudo, T., Hoshino, S., Wakana, S., Kishi, M., Tsuchiya, M., J. Lightw. Technol. 21, 3273 (2003) CrossRef
Vives-Gilabert, Y., Arcambal, C., Louis, A., Daran, F., Eudeline, P., Mazari, B., IEEE Trans. EMC 49, 391 (2007)
R. Rammal, M. Lalande, E. Martinod, N. Feix, M. Jouvet, J. Andrieu, B. Jecko, Int. J. Ant. Prop. 2009 (2009), art. ID 798473, doi: 10.1155/2009/798473 CrossRef
Malcovati, P., Maloberti, F., IEE Aerospace Electron. Syst. Mag. 14, 43 (1999) CrossRef
J.M. Bakhashwain, M.H. Shwehdi, U.M. Johar, A.A. Al-Naim, in Proc. of Int. Conf. on Non-Ionizing Radiation at UNITEN (ICNIR 2003), Malaysia
T. Tajima, A. Burrell, G. Eremeev, V. Dolgashev, D. Martin, C. Nantista, S. Tantawi, C. Yoneda, B.H. Moeckly, I. Campisi, IEEE ECNF 11 (2010)
F. Hongmei, in Proc. of IEEE EMC Symp., Austin, TX, USA, 2009, pp. 321–324
C.A. Balanis, Antenna theory: Analysis and design, 3rd edn. (Wiley, New York, 2005), pp. 207–208
Paris, D.T., Leach, W.M., Joy, E.B., IEEE Trans. Ant. Prop. 26, 373 (1978) CrossRef
Wang, J.J.H., IEEE Trans. Ant. Prop. 36, 741 (1988)
G.F. Masters, Probe-correction coefficients derived from near-field measurements, in Proc. of AMTA Conf., Denver, CO, USA, 1991
Shi, J., Cracraft, M.A., Slattery, K.P., Yamaguchi, M., DuBroff, R.E., IEEE Trans. EMC 47, 642 (2005)
M. Cauterman, I. Seignolles, D. Lecointe, J.C. Bolomey, in Proc. of Workshop on EMC Measurement Techniques for Complex and Distributed System, Lille, France, 2001
Leather, P.S.H., Parsons, J.D., Electron. Lett. 39, 1780 (2003) CrossRef
J. Shi, M.A. Cracraft, J. Zhang, R.E. DuBroff, in Proc. of IEEE Ant. Prop. Int. Symp., San Jose, CA, USA, 1989, Vol. 3, p. 1477
H. Junji, T. Yoshiaki, Method for Measuring Radiated Electric Field Exited by Linear Array Antenna Using Near-field to Far-field Transformation, in Proc. of 18th Int. Zurich Symp. on EMC, Munich, 2007, pp. 417–420
D. Baudry, M. Kadi, C. Arcambal, Z. Riah, Y. Vives, A. Louis, B. Mazari, IET Science Measurement & Technology (2009), Vol. 3, p. 72
Ravelo, B., PIER B 25, 171 (2010) CrossRef
Gureev, M.Y., Mironov, M.A., Akustičeskij Žurnal 53, 774 (2007)