Hostname: page-component-848d4c4894-r5zm4 Total loading time: 0 Render date: 2024-06-29T11:23:47.589Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of the evolution of the surface potential of a charging insulator by measuring the intensity of its X-ray characteristic peaks

Published online by Cambridge University Press:  25 October 2005

B. Askri ,
R. Renoud ,
K. Raouadi  and
J-P. Ganachaud
B. Askri
Affiliation:
IREENA (EA 1770), Faculté des Sciences et des Techniques de Nantes, 2 rue de la Houssinière, BP 92208, 44322 Nantes Cedex 03, France Laboratoire Matériaux, Organisation et Propriétés, Campus Universitaire, 1060 le Belvédère, Tunis, Tunisia
R. Renoud*
Affiliation:
IREENA (EA 1770), Faculté des Sciences et des Techniques de Nantes, 2 rue de la Houssinière, BP 92208, 44322 Nantes Cedex 03, France
K. Raouadi
Affiliation:
Laboratoire Matériaux, Organisation et Propriétés, Campus Universitaire, 1060 le Belvédère, Tunis, Tunisia
J-P. Ganachaud
Affiliation:
IREENA (EA 1770), Faculté des Sciences et des Techniques de Nantes, 2 rue de la Houssinière, BP 92208, 44322 Nantes Cedex 03, France
*
raphael.renoud@physique.univ-nantes.fr
Get access

Abstract

The charge developed in an insulator by an electron beam has often been studied by following the evolution of the secondary electron emission of the target. However this latter proves to be insufficient when one attempts to correlate it with physical properties of the sample such as its density of traps and their spatial distribution. An important step would be to have access to the time evolution of the surface potential Vs(t). However, this latter quantity is not easy to measure. In this paper, we propose a new method to measure the evolution of the surface potential by relating it to the X-ray emission induced by the electronic bombardment. More exactly, we show that there is a relation between the intensity of the characteristic peaks and the potential existing under the beam impact at a given instant of the charge. After having explained the method, we check its validity both experimentally and also by comparison with Monte Carlo simulations. We then present initial results obtained for amorphous SiO2 targets.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 32 , Issue 1 , October 2005 , pp. 29 - 36
Copyright
© EDP Sciences, 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cazaux, J., Eur. Phys. J. Appl. Phys. 15, 167 (2001) CrossRef
Mizuhara, Y., Kato, J., Nagatomi, Y., Takai, Y., Inoue, M., J. Appl. Phys. 92, 6128 (2002) CrossRef
X. Meyza, D. Goeuriot, C. Guerret-Piécourt, D. Tréheux, H-J. Fitting, J. Appl. Phys. 94, 5384 (2003)
Renoud, R., Mady, F., Attard, C., Bigarré, J., Ganachaud, J.-P., Phys. Status Solidi A 201, 2119 (2004) CrossRef
D. Braga, Ph.D. Thesis, University of Paris XI, 2003
H.-J. Fitting, Electroceramics IX, International Conference on Electroceramics and their Applications, Cherbourg, France, 2004, p. 31
Gryzinski, M., Phys. Rev. A 138, 305 (1965) CrossRef
S.T. Perkins, D.E. Cullen, M.H. Chen, J.H. Hubbell, J. Rathkopf, J. Scofield, Tables and graphs of atomic Subshell and relaxation data derived from the LLNL evaluated atomic data library (EADL), Z=1-100, Report UCRL-50400, Vol. 30 (Lawrence Livermore National Laboratory, Livermore, CA)
J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig, C.E. Lyman, C. Fiori, E. Lifshin, Sanning Electron Microscopy and X-Ray Microanalysis, 2nd edn. (New York, London, 1992), rap. Chap. 3, pp. 69–147
Vasudevan, V., Vasi, J., J. Appl. Phys. 74, 3224 (1993) CrossRef
D.J. DiMaria, in: The physics of SiO 2 and its interfaces, Proceedings of the International Topical Conference on the Physics of SiO 2 and its interfaces, edited by S.T. Pantelides (Pergamon Press, New-York, Oxford, Toronto, Sidney, Frankfurt, 1978), p. 160
Cazaux, J., X-Ray Spectrom. 25, 265 (1996) 3.0.CO;2-3>CrossRef
Mady, F., Renoud, R., Attard, C., Bigarré, J., Ganachaud, J.-P., Hourquebie, P., Eur. Phys. J. Appl. Phys. 20, 41 (2002) CrossRef
R. Renoud, Ph.D. Thesis, University of Lyon I, 1995
Bragga, D., Poumellec, B., Cannas, V., Blaise, G., Ren, Y., Kristensen, M., J. Appl. Phys. 96, 885 (2004) CrossRef