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Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

  • S. Lorbek (a1), G. Hlawacek (a1) (a2) and C. Teichert (a1)

Abstract

One of the important parameters in understanding the mechanism of the early stage of organic thin-film growth is the critical nucleus size i*. Here, submonolayer films of para-sexiphenyl grown on amorphous silicon dioxide substrates were investigated by means of atomic-force microscopy and have been analyzed using the recently proposed capture-zone scaling. Applying the generalized Wigner surmise we determine from the capture-zone distribution i* at room temperature and 373 K. The results are compared to traditional analysis by island-size scaling and the applicability of the capture-zone scaling is critically discussed with respect to island shape.

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Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

  • S. Lorbek (a1), G. Hlawacek (a1) (a2) and C. Teichert (a1)

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