Skip to main content Accessibility help

CoO doping effects on the ZnO films through EBPDV technique

  • Maria Inês Basso Bernardi (a1), Lauro June Queiroz Maia (a2), Eduardo Antonelli (a3), Alexandre Mesquita (a4), Maximo Siu Li (a1) and Lucianna Gama (a5)...


Nanometric Zn1–xCo xO (x = 0.020, 0.025 and 0.030 in mol.%) nanopowders were obtained from low temperature calcination of a resin prepared using the Pechini’s method. Firing the Zn1–xCoxO resin at 400 °C/2 h a powder with hexagonal structure was obtained as measured by X-ray diffraction (XRD). The powder presented average particle size of 40 nm observed by field emission scanning electronic microscopy (FE-SEM) micrographs and average crystallite size of 10 nm calculated from the XRD using Scherrer’s equation. Nanocrystalline Zn1–xCo xO films with good homogeneity and optical quality were obtained with 280–980 nm thicknesses by electron beam physical vapour deposition (EBPVD) under vacuum onto silica substrate at 25 °C. Scanning electron microscopy with field emission gun showed that the film microstructure is composed by spherical grains and some needles. In these conditions of deposition the films presented only hexagonal phase observed by XRD. The UV-visible-NIR and diffuse reflectance properties of the films were measured and the electric properties were calculated using the reflectance and transmittance spectra.


Corresponding author


Hide All
[1] Vinodkumar, R., Navas, I., Porsezian, K., Ganesan, V., Unnikrishnan, N.V., Mahadevan Pillai, V.P., Spectrochim Acta A 118, 724 (2014)
[2] Prakash, T., Jayaprakash, R., Espro, C., Neri, G., Kumar, E.R., J. Mater. Sci. 49, 1776 (2014)
[3] Bahsi, Z.B., Oral, A.Y., Opt. Mater. 29, 672 (2007)
[4] Urbina, A., Park, J.S., Lee, J.M., Kim, S.O., Kim, J.-S., Nanotechnology 24, 484013 (2013)
[5] Devi, S., Subrahmanyam, V.B., Gadkari, S.C., Gupta, S.K., Anal. Chim. Acta 568, 41 (2006)
[6] Birkmire, R.W., Eser, E., Annu. Rev. Mater. Res. 27, 625 (1997)
[7] Jeong, W.J., Kim, S.K., Park, G.C., Thin Solid Films 506–507, 180 (2006)
[8] Senadeera, G.K.R., Nakamura, K., Kitamura, T., Wada, Y., Yanagida, S., Appl. Phys. Lett. 83, 5470 (2003)
[9] Pan, C.J., Tu, C.W., Song, J.J., Cantwell, G., Lee, C.C., Pong, B.J., Chi, G.C., J. Cryst. Growth 282, 112 (2005)
[10] Sundaram, K.B., Khan, A., Thin Solid Films 295, 87 (1997)
[11] Mass, J., Bhattacharya, P., Katiyar, R.S., Mater. Sci. Eng. B 103, 9 (2003)
[12] Nunes, P., Fortunato, E., Martins, R., Int. J. Inorg. Mater. 3, 1125 (2001)
[13] Ataev, B.M., Bagamadova, A.M., Mamedov, V.V., Omaev, A.K., Rabadanov, M.R., J. Cryst. Growth 198, 1222 (1999)
[14] Lee, J., Ko, K., Park, B., J. Cryst. Growth 247, 119 (2003)
[15] Narasimhan, K.L., Pai, S.P., Palkar, V.R., Pinto, R., Thin Solid Films 295, 104 (1997)
[16] Ohayama, M., Kozuka, H., Yoko, T., Thin Solid Films 306, 78 (1997)
[17] Wang, M., Wang, J., Chen, W., Cui, Y., Wang, L., Mater. Chem. Phys. 97, 219 (2006)
[18] Natsume, Y., Sakata, H., Mater. Chem. Phys. 78, 170 (2002)
[19] Peng, F., Wang, H., Yu, H., Chen, S., Mater. Res. Bull. 41, 2123 (2006)
[20] Fujihara, S., Sasaki, C., Kimura, T., J. Eur. Ceram. Soc. 21, 2109 (2001)
[21] de Carvalho, H.B., de Godoy, M.P.F., Pais, R.W.D., Mir, M., Ortiz de Zevallos, A., Iikawa, F., Brasil, M.J.S.P., Chitta, V.A. , Ferraz, W.B. , Boselli, M.A., Sabioni, A.C.S., J. Appl. Phys. 108, 033914 (2010)
[22] Chiba, D., Yamanouchi, M., Matsukura, F., Ohno, H., Science 301, 943 (2003)
[23] Ohno, H., Chiba, D., Matsukura, F., Omiya, T., Abe, E., Dietl, T., Ohno, Y., Ohtani, K., Nature 408, 944 (2000)
[24] Schmidt, G., Ferrand, D., Molenkamp, L.W., Filip, A.T., van Wees, B.J., Phys. Rev. B 62, R4790 (2000)
[25] Dietl, T., Ohno, H., Matsukura, F., Cibert, J., Ferrand, D., Science 287, 1019 (2000)
[26] Ohring, M., Materials Science of Thin Film–Deposition and Structure (Academic Press, San Diego, 1992)
[27] De Vicente, F.S., Rubo, E.A.A., Li, M.S., Rev. Bras. Apl. Vácuo 23, 11 (2004)
[28] Sherrer, P., Göttinger Nachrichten Gesell 2, 98 (1918)
[29] Warren, B.E., X-Ray Diffraction (Dover, New York, 1990)
[30] Falyouni, F., Benmamas, L., Thiandoume, C., Barjon, J., Lusson, A., Galtier, P., Sallet, V., J. Vac. Sci. Technol. B 27, 1662 (2009)
[31] Maia, L.J.Q., Bernardi, M.I.B., Feitosa, C.A.C., Mastelaro, V.R., Zanatta, A.R., Hernandes, A.C., Thin Solid Films 457, 246 (2004)
[32] Terrier, C., Chatelon, J.P., Roger, J.A., Thin Solid Films 295, 95 (1997)
[33] Zou, J., Zhou, S., Xia, C., Zhang, X., Su, F., Peng, G., Li, X., Xu, J., Thin Solid Films 496, 205 (2006)
[34] Colfen, H., Mann, S., Angew. Chem. Int. Ed. Engl. 42, 2350 (2003)
[35] Kislov, N., Srinivasan, S.S., Emirov, Y., Stefanakos, E.K., Mater. Sci. Eng. B 153, 70 (2008)
[36] Caglar, M., Ilican, S., Caglar, Y., Thin Solid Films 517, 5023 (2009)
[37] Fox, M., Optical Properties of Solids (Oxford University Press, Oxford, 2010)
[38] Gersten, J.I., Smith, F.W., The Physics and Chemistry of Materials (Wiley & Sons, New York, 2001)

Related content

Powered by UNSILO

CoO doping effects on the ZnO films through EBPDV technique

  • Maria Inês Basso Bernardi (a1), Lauro June Queiroz Maia (a2), Eduardo Antonelli (a3), Alexandre Mesquita (a4), Maximo Siu Li (a1) and Lucianna Gama (a5)...


Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed.