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About the Photometric Calibration of IUE High Resolution Spectra: Quantification of the Order Overlap for the SWP Camera
Published online by Cambridge University Press: 04 August 2017
Abstract
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In order to quantify the errors in the IUE line profiles caused by the order overlap, we have compared line depths in IUE and Copernicus spectra. The excess line depth in IUE spectra suggests that the amount of order overlap is about 32% at 1150Å and decreases to zero at about 1400Å, for spectra extracted with the recent version of IUESISPS (the IUE standard extraction software). The transfer of a spectral feature from one order to the next is below the 5% level.
Based on these results, a correction technique is described.
- Type
- Research Article
- Information
- Symposium - International Astronomical Union , Volume 111: Calibration of Fundamental Stellar Quantities , 1985 , pp. 443 - 446
- Copyright
- Copyright © Reidel 1985
References
Bianchi, L.
1980, in IUE Data Reduction, ed. Weiss, W.
et al., (Vienna: Austrian Solar and Space Agency), p.161.Google Scholar
Bohlin, R. and Tunrose, B.
1982, NASA IUE newsletter N.18, p.29
and ESA IUE newsletter N.13, p.14.Google Scholar
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