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A Preliminary ion Source Background Study at Lalonde AMS

  • X-L Zhao (a1), C A Crann (a2), S Murseli (a2), G St-Jean (a2), W E Kieser (a1), M Wilk (a2), R J Cornett (a2) and I D Clark (a2)...

Abstract

Observation of the ion source generated background has been an area of focus during our routine analytical work. It is noted that the results of very-low-ratio samples are dependent upon the particular procedures for measurement using the present-day Cs+ sputter ion sources. When measured without excessive Cs+ fluxes and without interleafing with other higher-ratio samples and references, the accelerator mass spectrometry (AMS) sensitivity can be somewhat improved. In some cases, it appears possible to assess old radiocarbon (14C) samples to beyond the long-standing 60 kyr limit. A number of observational studies are made for the sole purpose of minimizing the final contamination to the rare isotopes that is generated within the ion source.

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Copyright

This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by-nc-sa/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.

Corresponding author

*Corresponding author. Email: xiaolei.zhao@uottawa.ca.

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Deceased.

Footnotes

References

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