Powder Diffraction: Volume 25 -

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

Only show content I have access to (19)

Over 3 years (208)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

< Back to all issues

Volume 25 - June 2010

Contents

Page 6 of 11

First
« Prev
3
4
5
6
7
8
9
Next »
Last

Denver X-Ray Conference

C-2 The Latest Development of Microfocusing Source Based Beam Modules and Their Applications
B. Kim, B. Verman, D. Wilcox, R. Samokyszyn, M. Young, L. Jiang
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-5 A New Geometry for 21st Century Diffraction
K. D. Rogers, J. Rogers, A. Dicken, P. Evans, J. W. Chan, X. Wang
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-15 A New Approach to High Throughput Diffraction Analysis
S. Roncallo, S. A. Ansari, D. W. Lane, O. Karimi, K. D. Rogers, J. M. Gregoire
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-24 Design and Development of Compound X-ray Optical Systems
B. Verman, D. Wilcox, B. Kim, R. Samokyszyn, M. Young, Y. Hua, L. Jiang, T. Ozawa, R. Matsuo, K. Omote, T. Osakabe, M. Aoyagi, K. Sumii
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-44 X-ray Source, Optic and Detector for Two-Dimensional XRD
B. B. He
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-45 Development of In Situ X-ray Diffraction System for Hydrothermal Reaction and Its Application to Autoclaved Aerated Concrete Formation
J. Kikuma, M. Tsunashima, T. Ishikawa, S. Matsuno, K. Matsui, A. Ogawa
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-61 New Instrumentation for X-ray Material Research
H. R. Ress, B. B. He, B. Jones, G. Vanhoyland
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-62 Clever Diffractometers with the Incoatec Microfocus Source
T. Samtleben, C. Michaelsen, B. Hasse, J. Graf, J. Wiesmann
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS
S. Rodrigues, P. Panine, V. Roger, P. Høghøj
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat
M. Fransen
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution
D. Lane, J. Lyons
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology
U. Waldschlaeger, M. Haschke
Published online by Cambridge University Press:

20 May 2016, p. 210
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-16 Readout ASICs for Silicon Drift Detectors
L. Bombelli, C. Fiorini, A. Celani, A. Longoni, R. Alberti, T. Frizzi, R. Nava
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-51 Bruker EDXRF New Product Releases and News 2010
A. Seyfarth, A. Gross, J. Patterson, B. Kaiser
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation
A. Niculae, A. Liebel, A. Simsek, O. Jaritschin, H. Soltau, A. Liebel, R. Eckhardt, G. Lutz, S. Jeschke, P. Lechner, L. Strüder, F. Schopper, G. Schaller, C. Fiorini
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF
M. Kraemer, T. Holz, R. Dietsch, D. Weissbach, G. Falkenberg, R. Simon, U. Fittschen, T. Krugmann, B. Beckhoff
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F-73 High-Definition XRF — Multiple Monochromatic Beams EDXRF — For Consumer Product Analysis
Z. W. Chen, S. Nayar
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering
B. G. Landes, B. J. Kern, T. J. Hermel-Davidock, M. Demirors, J. D. Weinhold, G. R. Marchand, K. Nanjundiah, R. E. Drumright, S. J. Weigand
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber
J. D. Londono, A. D. English, P. Langan, Y. Nishiyama, T. Forsyth
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)
E. Balizer, J. Fedderly, G. Lee, S. Bartyczak, W. Mock
Published online by Cambridge University Press:

20 May 2016, p. 211
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

Page 6 of 11

First
« Prev
3
4
5
6
7
8
9
Next »
Last

Powder Diffraction

Refine listing

Actions for selected content:

Volume 25 - June 2010

Denver X-Ray Conference

C-2 The Latest Development of Microfocusing Source Based Beam Modules and Their Applications

D-5 A New Geometry for 21st Century Diffraction

D-15 A New Approach to High Throughput Diffraction Analysis

D-24 Design and Development of Compound X-ray Optical Systems

D-44 X-ray Source, Optic and Detector for Two-Dimensional XRD

D-45 Development of In Situ X-ray Diffraction System for Hydrothermal Reaction and Its Application to Autoclaved Aerated Concrete Formation

D-61 New Instrumentation for X-ray Material Research

D-62 Clever Diffractometers with the Incoatec Microfocus Source

D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS

D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat

F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution

F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology

F-16 Readout ASICs for Silicon Drift Detectors

F-51 Bruker EDXRF New Product Releases and News 2010

F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation

F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF

F-73 High-Definition XRF — Multiple Monochromatic Beams EDXRF — For Consumer Product Analysis

D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering

D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber

D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)

Powder Diffraction

Refine listing

Actions for selected content:

Save Search

Volume 25 - June 2010

Denver X-Ray Conference