Powder Diffraction: Volume 23 -

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 23 - June 2008

Contents

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DENVER X-RAY CONFERENCE

D-19 High-Performance Silicon Strip Detector for In-House XRD System
T. Taguchi, H. Toraya, M. Kuribayashi, P. Grybos, R. Szczygiel, P. Maj
Published online by Cambridge University Press:

20 May 2016, p. 172
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D-6 X-ray Diffractometry with a Microfocus Source
B. Hasse, C. Michaelsen, U. Preckwinkel, H. Cordes, N. Yang
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20 May 2016, p. 172
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D-34 Wavelet Analysis of X-ray Diffraction Signal From Measurements of Stress and Austenite
G. Roy
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20 May 2016, p. 172
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D-51 New High-Performance Device for Parallel-Beam X-ray Diffractometer Scan
H. Toraya
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20 May 2016, p. 172
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D-25 An Innovative EDXRD Probe
C. M. Dozier, N. Anibou
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20 May 2016, p. 172
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D-66 Detectors for Demanding X-ray Diffraction Experiments
K. Knorr, B. Hinrichsen, G. Vanhoyland
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20 May 2016, p. 172
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F-71 New S2 PICOFOX Benchtop TXRF
A. Seyfarth, M. Rider, H. Stosnach, A. Gross
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20 May 2016, p. 172
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F-53 New Development for the Automation of Borate Fusion Sample Preparation for XRF
L. Bérubé
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20 May 2016, p. 173
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F-81 High Volume Scrap Material Sorting Using XRF
E. Brown, D. Carolan, X. Chen, J. Egan, B. Hubbard-Nelson, R. Nasella, I. Rosmarin, R. Russell, D. Sackett, C. Weaver
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20 May 2016, p. 173
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F-76 Turn-Key Solutions with Integrated Flexibility From Package to Real Solution
K. Behrens, K. Roscoe, A. Seyfarth
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20 May 2016, p. 173
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F-7 Development of a Novel Multi-Element Silicon Drift Detector Array
L. Feng, V. D. Saveliev, C. R. Tull, S. Barkan, M. Takahashi, E. V. Damron
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20 May 2016, p. 173
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F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window
A. Niculae, H. Soltau, G. Lutz, P. Lechner, A. Bechteler, R. Eckhardt, K. Hermenau, O. Jaritschin, A. Liebel, A. Simsek, G. Schaller, F. Schopper, L. Strüder
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20 May 2016, p. 173
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F-66 Mg-Based Multilayer XRF Analyzers with Two- and Three-Layers Structure Design
Y. Platonov, J. Rodriguez, G. Fournier, K. Shimizu
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20 May 2016, p. 173
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C-3 Microfocus Liquid-Metal-Jet X-ray Tubes and Applications
O. Hemberg, M. Otendal, T. Tuohimaa, H. M. Hertz
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20 May 2016, p. 173
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C-17 Invited—Formation of Novel Oxide Nanostructures
Z. L. Wang
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20 May 2016, p. 173
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C-18 Pulsed Laser Deposition Technique for the Synthesis of Nanostructures
J.-I. Hong, M. Kirkham, J. Bae, Z. L. Wang, R. L. Snyder
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20 May 2016, p. 173
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F-60 Invited—XAFS Studies of Nanosystems: How X-ray, Electron Microscopy, and Optical Techniques Each Contribute to Structural Characterization
B. A. Bunker
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20 May 2016, p. 173
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C-12 Invited—Hard X-ray Full Field 3D Imaging with sub-50 nm Resolution
A. Tkachuk, M. Feser, F. Duewer, J. Gelb, G. Hsu, S. Wang, W. Yun
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20 May 2016, p. 173
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D-57 Alumina-Supported Palladium Catalyst Crystallite Size Determination by EXAFS, XRD, and TEM
E. J. Peterson, T. R. Conant, P. Burton, A. De La Riva, J. P. Gabaldon, L. R. Houk, H. Pham, K. Lovato, J. Paiz, A. K. Datye
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20 May 2016, p. 173
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D-33 Invited—Natural Nanoparticle Shape, Structure, Properties and Reactivity from X-ray Studies
G. A. Waychunas, B. Gilbert, Y.-S. Jun, J. F. Banfield, H. Zhang, C. Kim
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20 May 2016, p. 173
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Page 6 of 17

First
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3
4
5
6
7
8
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Next »
Last

Powder Diffraction

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Volume 23 - June 2008

DENVER X-RAY CONFERENCE

D-19 High-Performance Silicon Strip Detector for In-House XRD System

D-6 X-ray Diffractometry with a Microfocus Source

D-34 Wavelet Analysis of X-ray Diffraction Signal From Measurements of Stress and Austenite

D-51 New High-Performance Device for Parallel-Beam X-ray Diffractometer Scan

D-25 An Innovative EDXRD Probe

D-66 Detectors for Demanding X-ray Diffraction Experiments

F-71 New S2 PICOFOX Benchtop TXRF

F-53 New Development for the Automation of Borate Fusion Sample Preparation for XRF

F-81 High Volume Scrap Material Sorting Using XRF

F-76 Turn-Key Solutions with Integrated Flexibility From Package to Real Solution

F-7 Development of a Novel Multi-Element Silicon Drift Detector Array

F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window

F-66 Mg-Based Multilayer XRF Analyzers with Two- and Three-Layers Structure Design

C-3 Microfocus Liquid-Metal-Jet X-ray Tubes and Applications

C-17 Invited—Formation of Novel Oxide Nanostructures

C-18 Pulsed Laser Deposition Technique for the Synthesis of Nanostructures

F-60 Invited—XAFS Studies of Nanosystems: How X-ray, Electron Microscopy, and Optical Techniques Each Contribute to Structural Characterization

C-12 Invited—Hard X-ray Full Field 3D Imaging with sub-50 nm Resolution

D-57 Alumina-Supported Palladium Catalyst Crystallite Size Determination by EXAFS, XRD, and TEM

D-33 Invited—Natural Nanoparticle Shape, Structure, Properties and Reactivity from X-ray Studies

Powder Diffraction

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Volume 23 - June 2008

DENVER X-RAY CONFERENCE