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X-ray powder diffraction analysis of a nonlinear optical material N-(p-methoxy benzoyl)-N-(o-methyl phenyl) thiourea

Published online by Cambridge University Press:  05 March 2012

Weiqun Zhou
Affiliation:
Chemistry Department, Suzhou University, 1 Shizi Street, Suzhou 215006, People’s Republic of China
Zhenjiang Zhang*
Affiliation:
Chemistry Department, Suzhou University, 1 Shizi Street, Suzhou 215006, People’s Republic of China
Zheng Jin
Affiliation:
Suzhou Testing Institute of Technology, 5 Minzhi Road, Suzhou 215006, People’s Republic of China
Zong-ming Jin
Affiliation:
Central Laboratory, Suzhou University, 1 Shizi Street, Suzhou 215006, People’s Republic of China
*
a)Electronic mail: zzj225@cmmail.com

Abstract

A nonlinear optical material, N-(p-methoxy benzoyl)-N(o-methyl phenyl) thiourea (C16H16N2O2S), has been characterized by X-ray powder diffraction. Experimental values of 2θ corrected for systematic errors, relative peak intensities, values of d, and the Miller indices of 90 observed reflections with 2θ up to 88° are reported. The powder diffraction data have been evaluated, and the figures-of-merit are reported. The least-squares refined unit cell parameters are a=26.7079(3) Å, b=6.7995(9) Å, c=19.2845(1) Å, β=121.39(4), V=2989.42(3) Å3, Z=8, Dx=1.334(8) g/cm3, space group P2(3).

Type
New Diffraction Data
Copyright
Copyright © Cambridge University Press 2002

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