Hostname: page-component-84b7d79bbc-g78kv Total loading time: 0 Render date: 2024-07-26T13:51:26.328Z Has data issue: false hasContentIssue false
  • English
  • Français

Trace element analysis using a benchtop total reflection X-ray fluorescence spectrometer

Published online by Cambridge University Press:  01 March 2012

Hagen Stosnach
Hagen Stosnach*
Affiliation:
Röntec GmbH, Berlin, Germany
*
a)Electronic mail: stosnach@roentec.de
Get access Rights & Permissions [Opens in a new window]

Abstract

Total reflection X-ray fluorescence analysis (TXRF) is an established technique for trace element analysis in various sample types. Restricted in the past to expensive large-scale systems, in this study the capability of a benchtop system for trace element analysis is reported. By analysing various heavy metals in raw and digested sewage as well as mercury in recycling glass, the suitability of the TXRF system for these kinds of applications could be proven. Based on this data, the benefits, disadvantages, and restrictions of the benchtop system in comparison to other trace element techniques like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic adsorption spectroscopy (AAS) are evaluated.

Type
XRD Instrumentation and Techniques
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 141 - 145
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

CV-AAS, Norm 2/99-1194, International Commission on Glass-ICG/TC2.Google Scholar
Exner, A. et al. (2000). Fresenius' J. Anal. Chem. FJACES 366, 254–259.CrossRefGoogle Scholar
Fabry, L. et al. (1996). Surf. Interface Anal. SIANDQ 24, 511–516.Google Scholar
Flanagan, F. J. et al. (1982). Geostandard Newslett. 6, 25–46.CrossRefGoogle Scholar
Klockenkämper, R. (1997). Total Reflection X-Ray Analysis (Wiley, New York), p. 245.Google Scholar
Mages, M. et al. (2001). Spectrochim. Acta, Part B SAASBH 10.1016/S0584-8547(01)00325-1 56, 2209–2217.CrossRefGoogle Scholar
Mages, M. et al. (2003). Spectrochim. Acta, Part B SAASBH 10.1016/S0584-8547(03)00197-6 58, 2129–2138.CrossRefGoogle Scholar
Potts, J. P. et al. (2001). J. Anal. At. Spectrom. JASPE2 10.1039/b106821k 16, 1217–1237.CrossRefGoogle Scholar
Schmeling, H. (2001). Spectrochim. Acta, Part B SAASBH 10.1016/S0584-8547(01)00284-1 56, 2127–2136.CrossRefGoogle Scholar
Streli, C. et al. (2001). X-Ray Spectrom. XRSPAX 20, 24–29.CrossRefGoogle Scholar
Water pollution control regulation, SR 814 201, Appendix 3.2., 18.12.2001.Google Scholar