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Temperature dependant structural changes in thin films of random semifluorinated PMMA copolymers

Published online by Cambridge University Press:  14 November 2013

Dieter Jehnichen*
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Peter Friedel
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Romy Selinger
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Andreas Korwitz
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Martin Wengenmayr
Affiliation:
Technische Universität Chemnitz, Straße der Nationen 62, D-09111 Chemnitz, Germany
Andreas Berndt
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Doris Pospiech
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
*
a)Author to whom correspondence should be addressed. Electronic mail: djeh@ipfdd.de

Abstract

Semifluorinated (SF) side chain polymers show phase separation between polymer backbone and SF side chains. Due to strong interaction between SF segments the side chains determine the structure behaviour strongly, often resulting in layered structures in which backbones and layers of SF side chains alternate. The interest in this work was directed to find out the dependence of these structures on concentration of SF side chains. Thin films of random copolymers consisting of methylmethacrylate (MMA) and semifluorinated side chain methacrylate (SFMA) segments and with different fluorine content in the perfluoroalkyl side chains (abbreviated as H10F10 and H2F8) were prepared by spin-coating. Phase separation and structure changes were initiated by external subsequent annealing. Corresponding bulk material served as basic information. Generation of ordered structures and variation of film parameters were observed using different X-ray scattering methods (XRR, GIWAXS, and GISAXS). The phase behaviour in bulk is governed by the SF side chain amount and their specific fluorine content which control the self-organization tendency of SF side chains. Additionally, the confinement in thin films generates an orientation of side chains normally to film surface.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2013 

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